1 edition of High-temperature crack-arrest tests using 152-mm-thick SEN wide plates of low-upper-shelf base material found in the catalog.
High-temperature crack-arrest tests using 152-mm-thick SEN wide plates of low-upper-shelf base material
1990 by Division of Engineering, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission in Washington, DC .
Written in English
|Other titles||High temperature crack arrest tests using ....|
|Statement||prepared by D.J. Naus ... [et al.].|
|Contributions||Naus, D., U.S. Nuclear Regulatory Commission. Office of Nuclear Regulatory Research. Division of Engineering., Oak Ridge National Laboratory.|
|The Physical Object|
|Pagination||xxviii, 115 p. :|
|Number of Pages||115|
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